Laser & Optoelectronics Progress, Volume. 58, Issue 19, 1905001(2021)

Diffraction Intensity Distribution of Pinhole for Misaligned Gaussian Beam Incidence

Tong Zhang1, Fen Gao1,2、*, Bing Li2, and Ailing Tian1
Author Affiliations
  • 1School of Optoelectronic and Engineering, Xi'an Technological University, Xi'an , Shaanxi 710021, China
  • 2State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an , Shaanxi 710049, China
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    Figures & Tables(10)
    Intensity distribution model of pinhole diffraction under Gaussian beam incidence
    Diffraction field distribution models of pinhole under different alignment conditions.(a)Ideal condition;(b)shift error;(c)defocus error;(d)tilt error
    Intensity distributions of pinhole diffraction under different waists (when d=2 μm). (a) Normalized intensity curve;(b) partially enlarged view
    Diffraction intensity maps of pinhole with different shift errors (when d=2 μm). (a) dx=0 μm; (b) dx=0.5 μm; (c) dx=1.0 μm; (d) dx=1.5 μm
    Intensity normalization curves of pinhole diffraction under different shift error (when d=2 μm). (a) Normalized intensity curves; (b) partially enlarged view
    Diffraction intensity maps of pinhole for different defocus errors (when d=2 μm). (a) dz=0; (b) dz=10d; (c) dz=20d; (d) dz=30d
    Intensity normalization curves of pinhole diffraction under different defocus error (when d=2 μm). (a) Normalized intensity curves; (b) partially enlarged view
    Change of normalized intensity along with defocus error dz under different diameters
    Diffraction intensity maps of pinhole for different tilt errors (when d=5 μm). (a) γ=0°; (b) γ=5°; (c) γ=10°; (d) γ=15°
    Center offset value of diffraction spot Δy varying with tilt angle γ
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    Tong Zhang, Fen Gao, Bing Li, Ailing Tian. Diffraction Intensity Distribution of Pinhole for Misaligned Gaussian Beam Incidence[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1905001

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    Paper Information

    Category: Diffraction and Gratings

    Received: Dec. 15, 2020

    Accepted: Dec. 27, 2020

    Published Online: Sep. 29, 2021

    The Author Email: Gao Fen (gaofen8128@163.com)

    DOI:10.3788/LOP202158.1905001

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