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Infrared and Laser Engineering, Volume. 34, Issue 4, 415(2005)

Analysis of sampled grating DBR semiconductor lasers using transfer matrix method

[in Chinese]1,2、*, [in Chinese]3, [in Chinese]1, [in Chinese]4, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis of sampled grating DBR semiconductor lasers using transfer matrix method[J]. Infrared and Laser Engineering, 2005, 34(4): 415

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    Paper Information

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    Received: Sep. 5, 2004

    Accepted: Oct. 11, 2004

    Published Online: May. 25, 2006

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology