Micro Energy Dispersive X-Ray Diffraction Analysis by Polycapillary X-Ray Optics Focusing

Zeming Duan; Qili Jiang; Jun Liu; Qiuli Pan; Lin Cheng

doi:10.3788/AOS201838.1230002

Acta Optica Sinica, Volume. 38, Issue 12, 1230002(2018)

Micro Energy Dispersive X-Ray Diffraction Analysis by Polycapillary X-Ray Optics Focusing

Zeming Duan^1,2、*, Qili Jiang^1,2, Jun Liu^1,2, Qiuli Pan^1,2, and Lin Cheng^1,2、*

¹ Key Laboratory of Beam Technology and Material Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China

² Beijing Radiation Center, Beijing 100875, China

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Figures & Tables(10)

Fig. 1. Schematic of polycapillary X-ray optics

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Fig. 2. Schematic of scanning area of coin sample

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Fig. 3. Energy spectrum in scanning area of coin sample

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Fig. 4. Crystal phase mappings in scanning area of coin sample. (a) Cu3Sn(0 8 3); (b) Sn(6 4 2); (c) CuO(2 0 2)

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Fig. 5. Energy spectrum of coin sample measured by X-pert-pro-MPD XRD spectrometer

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Fig. 6. Ore particle sample

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Fig. 7. Energy spectrum in scanning area of ore particle sample

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Fig. 8. Crystal phase mappings in scanning area of ore particle sample. (a) Fe2O3(1 1 6); (b) Fe2O3(0 2 10);(c) SiO2(3 2 9); (d) SiO2(3 1 4)

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Table 1. Micro-area data of coin sample measured by our spectrometer and reference data

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Table 1. Micro-area data of coin sample measured by our spectrometer and reference data

Measurement data				Reference data
	E /keV	n	d /nm	PDF card number	d /nm	(h k l)
6.34	1	0.1385		Cu₃Sn#01-1240	0.1380	(0 8 3)
7.59	1	0.1155		CuO#45-0937	0.1155	(4 0 0)
10.10	1	0.0869		Sn#05-0390	0.0867	(6 4 2)
11.22	2	0.1563		CuO#48-1548	0.1582	(2 0 2)
11.90	2	0.1474		Cu₂O#34-1354	0.1486	(2 2 0)
13.65	2	0.1284		Cu#04-0836	0.1278	(2 2 0)
15.10	2	0.1162		CuO#45-0937	0.1161	(2 2 2)
16.01	2	0.1095		Cu#04-0836	0.1090	(3 1 1)

Table 2. Data of ore particle sample measured by our spectrometer and reference data

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Table 2. Data of ore particle sample measured by our spectrometer and reference data

Measurement data			Reference data
E /keV	n	d /nm	PDF card number	d /nm	(h k l)
2.48	1	0.3535	SiO₂#51-1380	0.3523	(-5 1 0)
3.30	1	0.2657	Fe₂O₃#40-1139	0.2648	(1 1 6)
3.67	1	0.2389	SiO₂#51-1377	0.2381	(3 1 4)
4.44	1	0.1974	Fe₂O₃#16-0653	0.1973	(-4 4 1)
5.04	1	0.1739	SiO₂#51-1382	0.1738	(3 2 9)
7.53	1	0.1164	Fe₂O₃#33-0664	0.1163	(0 2 10)
10.04	1	0.0873	SiO₂#27-0605	0.0871	(7 3 3)
12.49	2	0.1404	SiO₂#52-1425	0.1404	(5 1 4)
14.97	2	0.1171	SiO₂#14-0654	0.1171	(-4 8 2)

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Zeming Duan, Qili Jiang, Jun Liu, Qiuli Pan, Lin Cheng. Micro Energy Dispersive X-Ray Diffraction Analysis by Polycapillary X-Ray Optics Focusing[J]. Acta Optica Sinica, 2018, 38(12): 1230002

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Paper Information

Category: Spectroscopy

Received: Jun. 28, 2018

Accepted: Aug. 13, 2018

Published Online: May. 10, 2019

The Author Email:

DOI:10.3788/AOS201838.1230002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology