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Spectroscopy and Spectral Analysis, Volume. 36, Issue 6, 1745(2016)

Reliability Study of Grating Coupled Semiconductor Laser Based on Raman Spectra Technique

Jia Peng1,2, Qin Li1、*, Zhang Xing1, Zhang Jian1, Liu Tianyuan3, Men Zhiwei3, and Ning Yongqiang1
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Jia Peng, Qin Li, Zhang Xing, Zhang Jian, Liu Tianyuan, Men Zhiwei, Ning Yongqiang. Reliability Study of Grating Coupled Semiconductor Laser Based on Raman Spectra Technique[J]. Spectroscopy and Spectral Analysis, 2016, 36(6): 1745

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    Paper Information

    Received: Feb. 14, 2015

    Accepted: --

    Published Online: Nov. 16, 2020

    The Author Email: Li Qin (qinl@ciomp.ac.cn)

    DOI:10.3964/j.issn.1000-0593(2016)06-1745-04

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology