Infrared and Laser Engineering, Volume. 49, Issue 8, 20190532(2020)
System design for beam coupling and alignment monitoring of chip spectrometer
Fig. 1. Sketch of system for incident beam coupling and alignment monitoring of chip spectrometer
Fig. 2. Set the image plane tilt according to the Scheimpflug condition
Fig. 3. Coupling system structure
Fig. 4. Schematic diagram of increase the distance between the fiber and the spectrometer
Fig. 5. Coupling system energy diagram
Fig. 6. Monitoring system structure
Fig. 7. Spots diagram of different wavelengths and fields of views
Fig. 8. MTF of monitoring system
Fig. 9. Structure of integrated optical system for incident beam coupling and alignment monitoring of chip spectrometer
Optical design parameters
光学设计参数
Optical design parameters
光学设计参数
|
Coupling system lens data
耦合系统透镜数据
Coupling system lens data
耦合系统透镜数据
|
Monitoring system lens data
监测系统透镜数据
Monitoring system lens data
监测系统透镜数据
|
Get Citation
Copy Citation Text
Zhiying Liu, Xin Jiang, Mingyu Li, Wenbo Jia. System design for beam coupling and alignment monitoring of chip spectrometer[J]. Infrared and Laser Engineering, 2020, 49(8): 20190532
Category: 光电测量
Received: Dec. 5, 2019
Accepted: --
Published Online: Dec. 31, 2020
The Author Email: