Acta Optica Sinica, Volume. 7, Issue 11, 1029(1987)
Measurement of layer-thickness variation in the hardening process of adhesive by real-time holography
Get Citation
Copy Citation Text
WANG WENSHENG, B. PFISTER. Measurement of layer-thickness variation in the hardening process of adhesive by real-time holography[J]. Acta Optica Sinica, 1987, 7(11): 1029