Acta Optica Sinica, Volume. 7, Issue 11, 1029(1987)
Measurement of layer-thickness variation in the hardening process of adhesive by real-time holography
In this article real-time holography with electro-optic BSO crystal (Bi12SiO20) as the holographic material and automatic hologram calculation of 3-interferogram-method in a computer-controlled holographic setup is theoretically and experimentally studied. This new holographic material and automatic hologram calculation method make it possible to use the real-time holography in industry. As a practical example, a layer thickness variation in the hardening process in 4 hours of a 2-component-adhesive was measured as a function of time.
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WANG WENSHENG, B. PFISTER. Measurement of layer-thickness variation in the hardening process of adhesive by real-time holography[J]. Acta Optica Sinica, 1987, 7(11): 1029