Acta Optica Sinica, Volume. 38, Issue 12, 1215001(2018)

Cross-Scale Registration Method Based on Fractal Dimension Characterization

Chengwei Mo1、*, Haihua Cui1、*, Xiaosheng Cheng1, and Haibin Yao2
Author Affiliations
  • 1 College of Electrical and Mechanical, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China
  • 2 Yangzhou Polytechnic College, Yangzhou, Jiangsu 225009, China
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    Figures & Tables(14)
    Cross-scale data obtained by different measurement configures
    Multilevel wavelet transform space
    Process of two-dimensional discrete wavelet transform
    Flowchart of ICP algorithm
    Surface texture of cutting tool
    Three-dimensional topographical data at different magnifications. (a) 20×; (b) 50×; (c) 100×
    (a) Raw data; three-dimensional data after DWT at (b) level 3 and (c) level 5
    Two-dimensional contour of different levels at the same position of DWT data. (a) Level 0; (b) level 1; (c) level 2; (d) level 3; (e) level 4; (f) level 5
    Logarithmic graph of (a) raw data at magnification of 100× and data after DWT at (b) level 3 and (c) level 5
    Logarithmic graph of raw data at different magnifications. (a) 20×; (b) 50×; (c) 100×
    (a) Registration results of scale-approximated data of level 3 wavelet approximation of 100× small scale data and 20× data; (b) apply the transform matrix on raw data; (c)(d) corresponding local magnification diagram
    (a) Two-dimensional contour of registration result of scale-approximated data; (b) two-dimensional contour of raw data after applying transform matrix
    • Table 1. Fractal dimension of data after DWT at different levels

      View table

      Table 1. Fractal dimension of data after DWT at different levels

      LevelFractal dimension
      Raw data (0)2.42649
      12.35152
      22.30153
      32.24905
      42.23375
      52.19663
    • Table 2. Fractal dimensions of raw data at different magnifications

      View table

      Table 2. Fractal dimensions of raw data at different magnifications

      MagnificationFractal dimension
      20×2.24281
      50×2.39668
      100×2.42649
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    Chengwei Mo, Haihua Cui, Xiaosheng Cheng, Haibin Yao. Cross-Scale Registration Method Based on Fractal Dimension Characterization[J]. Acta Optica Sinica, 2018, 38(12): 1215001

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    Paper Information

    Category: Machine Vision

    Received: May. 24, 2018

    Accepted: Jul. 12, 2018

    Published Online: May. 10, 2019

    The Author Email:

    DOI:10.3788/AOS201838.1215001

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