Opto-Electronic Engineering, Volume. 33, Issue 3, 17(2006)

New testing approach for sighting error and non-perpendicularity between horizontal axis and vertical axis for a photoelectrical theodolite

[in Chinese] and [in Chinese]
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    [in Chinese], [in Chinese]. New testing approach for sighting error and non-perpendicularity between horizontal axis and vertical axis for a photoelectrical theodolite[J]. Opto-Electronic Engineering, 2006, 33(3): 17

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    Paper Information

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    Received: Feb. 10, 2005

    Accepted: --

    Published Online: Nov. 14, 2007

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