Opto-Electronic Engineering, Volume. 33, Issue 3, 17(2006)
New testing approach for sighting error and non-perpendicularity between horizontal axis and vertical axis for a photoelectrical theodolite
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[in Chinese], [in Chinese]. New testing approach for sighting error and non-perpendicularity between horizontal axis and vertical axis for a photoelectrical theodolite[J]. Opto-Electronic Engineering, 2006, 33(3): 17
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