Chinese Journal of Quantum Electronics, Volume. 37, Issue 3, 321(2020)

Research of performance test system of avalanche diode

Hang YIN1...2,*, Zhanyong HONG1,2 and Chuanyang DING3 |Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    YIN Hang, HONG Zhanyong, DING Chuanyang. Research of performance test system of avalanche diode[J]. Chinese Journal of Quantum Electronics, 2020, 37(3): 321

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Dec. 3, 2019

    Accepted: --

    Published Online: Nov. 6, 2020

    The Author Email: Hang YIN (863958203@qq.com)

    DOI:10.3969/j.issn.1007-5461. 20.010

    Topics