Chinese Journal of Quantum Electronics, Volume. 37, Issue 3, 321(2020)
Research of performance test system of avalanche diode
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YIN Hang, HONG Zhanyong, DING Chuanyang. Research of performance test system of avalanche diode[J]. Chinese Journal of Quantum Electronics, 2020, 37(3): 321
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Received: Dec. 3, 2019
Accepted: --
Published Online: Nov. 6, 2020
The Author Email: Hang YIN (863958203@qq.com)