Acta Optica Sinica, Volume. 17, Issue 12, 1759(1997)

Collimating Optical Component systems Using Heterodyne Interferometer

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(3)

    [1] [1] O. Katsuyuki, S. Hironobu, O. Teruji et al.. Separate measurements of surface shapes and refractive index inhomogeneity of an optical element using tunable-source phase shifting interferometry. Appl. Opt., 1990, 29(19): 3280~3285

    [2] [2] K. Tatsuno, Y. Tsunoda. Diode laser direct modulation heterodyne interferometer. Appl. Opt., 1987, 26(1): 37~40

    [3] [3] J. Chen, Y. Ishii, M. Murata. Heterodyne interferometry with a frequency-modulated laser diode. Appl. Opt., 1988, 27(1): 124~128

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Collimating Optical Component systems Using Heterodyne Interferometer[J]. Acta Optica Sinica, 1997, 17(12): 1759

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 6, 1996

    Accepted: --

    Published Online: Oct. 31, 2006

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