[1] [1] T. Kihara, K. Yokomori. Simultaneous measurement of refractive index and thickness of thin film by polarized reflectances［J］. Appl. Opt., 1990, 29(34): 5069～5073

[2] [2] A. Rosencwaig, J. Opsal, D. Willenborg et al.. Beam profile reflectometry: a new technique for dielectric film measurements［J］. Appl. Phys. Lett., 1992, 60(11): 1301～1303

[3] [3] D. Wood, J. Fleming. Computerized refractive index measurements for bulk materials at UV, visible, and IR wavelengths［J］. Rev. Scient. Instrum., 1982, 53(1): 43～47

[4] [4] R. M. A. Azzam, A. R. M. Zaghloul. Polarization-independent reflectance matching (PRIM): a technique for the determination of the refractive index and thickness of transparent films［J］. J. Opt., 1977, 8(3): 201～205

[5] [5] A. Beléndez, T. Beléndez, C. Neipp et al.. Determination of the refractive index and thickness of holographic silver halide materials by use of polarized reflectances［J］. Appl. Opt., 2002, 41(32): 6802～6808

[6] [6] Huang Zuohua, He Zhenjiang, Yang Guanling et al.. The multifunctional ellipsometer ［J］. Optical Technique, 2001, 27(5): 432～434

[7] [7] Huang Zuohua, He Zhenjiang. The optical methods for measuring the thickness and refractive index of thin films［J］. Modern Scientific Instruments, 2003, (4): 42～44

[8] [8] M. H. Chiu, J. Y. Lee, D. C. Su. Complex refractive-index measurement based on Fresnel′s equations and the uses of heterodyne interferometry［J］. Appl. Opt., 1999, 38(19): 4047～4052

[9] [9] H. Onodera, I. Awai, J. Ikenoue. Refractive-index measurement of bulk materials: prism coupling method［J］. Appl. Opt., 1983, 22(8): 1194～1197

[10] [10] P. K. Tien, R. Ulrich. Theory of prism-film coupler and thin-film light guides［J］. J. Opt. Soc. Am., 1970, 60(10): 1325～1337

[11] [11] Zhao Xiaoxiang, Xu Zhengquan. Measurement of refractive index of substrate materials of optical waveguides with a prism coupler［J］. Chinese J. Lasers, 1992, 19(6): 426～429

[12] [12] Fang Junxin, Cao Zhuangqi, Yang Fuzi. Waveguide Technology Physical Basis［M］. Shanghai: Shanghai Jiaotong University Press, 1987. 204～224

[13] [13] R. Ulrich, R. Torge. Measurement of thin film parameters with a prism coupler［J］. Appl. Opt., 1973, 12(12): 2901～2908

[14] [14] Li Honggen, Shen Qishun, Cao Zhuangqi et al.. Direct coupling for double metal-cladding waveguides［J］. Acta Optica Sinica, 2002, 22(8): 924～926

[15] [15] H. Li, Z. Cao, H. Lu et al.. Free-space coupling of a light beam into a symmetrical metal-cladding optical waveguide ［J］. Appl. Phys. Lett., 2003, 83(14): 2757～2759

[16] [16] S. Herminghaus, B. A. Smith, J. Swalen. Electro-optic coefficients in electric-field-poled polymer waveguides［J］. J. Opt. Soc. Am. B, 1991, 8(11): 2311～2317

[17] [17] Wang Jiaxian, Li Junjie, Wu Wenguang et al.. Coupled-mode characteristics of coupled-microdisks and single microdisk cavity with an output waveguide［J］. Acta Optica Sinica, 2011, 31(1): 0106006

[18] [18] Zhang Jianing, Han Xiuyou, Song Hongyan et al.. Study on time delay characteristics of integrated waveguide microring resonator with tunable coupler［J］. Acta Optica Sinica, 2010, 30(7): 2098～2103

[19] [19] Cui Naidi, Liang Jingqiu, Liang Zhongzhu et al.. Photonic crystal single channel side-coupled waveguide with parallel resonators［J］. Acta Optica Sinica, 2012, 32(2): 0223001