Chinese Optics Letters, Volume. 10, Issue s2, S21601(2012)
Grain boundary segregation in Dy doped ceria by TEM and laser-assisted 3D atom probe
A combination of transmission electron microscopy (TEM) and laser-assisted three-dimensional atom probe (3DAP) is employed to study the nanostructure of Dy-doped CeO2, which is a promising ionic conductor. Segregation of Dy atoms at grain boundaries is observed by electron energy loss spectroscopy (EELS) elemental maps. The segregation is checked and confirmed by laser-assisted 3DAP. Moreover, the enrichment of Dy and deficiency of Ce at grain boundaries are quantitatively identified by the 3DAP concentration profile. Data such as these are significant to optimize the electrical conductive property in rare-earth doped Ceria.
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Fang Li. Grain boundary segregation in Dy doped ceria by TEM and laser-assisted 3D atom probe[J]. Chinese Optics Letters, 2012, 10(s2): S21601
Category: Materials
Received: Mar. 14, 2012
Accepted: Jul. 23, 2012
Published Online: Dec. 6, 2012
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