Infrared and Laser Engineering, Volume. 44, Issue 12, 3762(2015)

Surface profile measuring system based on fringe projection and sinusoidal phase modulation

Feng Fan*, Duan Fajie, Bo En, Lv Changrong, Fu Xiao, and Huang Tingting
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    Feng Fan, Duan Fajie, Bo En, Lv Changrong, Fu Xiao, Huang Tingting. Surface profile measuring system based on fringe projection and sinusoidal phase modulation[J]. Infrared and Laser Engineering, 2015, 44(12): 3762

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    Paper Information

    Category: 光电测量

    Received: Apr. 10, 2015

    Accepted: May. 12, 2015

    Published Online: Jan. 26, 2016

    The Author Email: Fan Feng (tjufengfan@163.com)

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