Infrared and Laser Engineering, Volume. 44, Issue 12, 3762(2015)
Surface profile measuring system based on fringe projection and sinusoidal phase modulation
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Feng Fan, Duan Fajie, Bo En, Lv Changrong, Fu Xiao, Huang Tingting. Surface profile measuring system based on fringe projection and sinusoidal phase modulation[J]. Infrared and Laser Engineering, 2015, 44(12): 3762