Acta Photonica Sinica, Volume. 52, Issue 12, 1212001(2023)

Ball Surface Defect Detection Technology Based on Dark Field Line Scanning Technology

Han HUANG1, Zhoumiao SHI2, Yushu SHI2,3, Shu ZHANG2,3、*, and Jiacheng HU1
Author Affiliations
  • 1College of Metroogy & Measurement Engineering,University of China Jiling,Hangzhou 310018,China
  • 2Shenzhen Institute for Technology Innovation,NIM,Shenzhen 518107,China
  • 3Center for Advanced Measurement Science,National Institute of Metrology,Beijing 100029,China
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    Figures & Tables(21)
    Schematic diagram of dark field detection principle
    A conventional light source illuminates the surface of the ball
    Incident light simulation
    Single scan path diagram
    Ball pretreatment process
    Cylindrical projection diagram
    Part of the image before and after low frequency filtering
    Spherical three-dimensional coordinate system
    Algorithm verification using two-dimensional graph
    Single sphere-ring reconstruction experiment
    Point rotation diagram
    Spherical three-dimensional point cloud stitching process
    Triangulation diagram
    Traditional bright field array detection
    Defect area dark field linear array detection results
    Two steel balls under test
    Non-destructive steel ball dark field line scanning image
    Dark field line scanning image of worn steel ball
    3D reconstruction results of surface defects of steel ball
    Filter results of defect points in 3D point cloud model
    • Table 1. The analysis results of repeatability detection

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      Table 1. The analysis results of repeatability detection

      Data number1234567891011121314151617181920Repeatability
      Lossless ball21202020192021202120202021192020202120200.14%
      Wear ball989797102999897981041029798979610099989597950.11%
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    Han HUANG, Zhoumiao SHI, Yushu SHI, Shu ZHANG, Jiacheng HU. Ball Surface Defect Detection Technology Based on Dark Field Line Scanning Technology[J]. Acta Photonica Sinica, 2023, 52(12): 1212001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 29, 2023

    Accepted: Jun. 21, 2023

    Published Online: Feb. 19, 2024

    The Author Email: ZHANG Shu (zhangshu@nim.ac.cn)

    DOI:10.3788/gzxb20235212.1212001

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