Laser & Optoelectronics Progress, Volume. 58, Issue 12, 1212003(2021)

Single Pixel Detection Theory of Flat Surface Reflectivity Anomaly

Haoyi Ouyang, Wanjun Chen, Hai Li**, and Chuping Yang*
Author Affiliations
  • College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong 510642, China
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    Figures & Tables(13)
    Direct detection of surface scattering light
    Measurement coordinate system
    Schematic diagram of system
    Illuminance-signal curve under uniform illumination
    Spatial distribution of radiation flux measured when the measured plane is evenly divided with different spatial resolutions under uniform illumination (left) and its theoretical calculation results (right). (a) 8×8; (b) 16×16; (c) 32×32
    Actual illuminance distribution and theoretical illuminance distribution to achieve uniform radiation flux distribution(resolution: 8×8). (a) Actual illuminance distribution; (b) theoretical illuminance distribution
    Detection of total radiant flux of ceramic tile (illuminance design distribution on sample)
    Seven samples. (a) Sample a; (b) sample b; (c) sample c; (d) sample d; (e) sample e; (f) sample f; (g) sample g
    Two cracked samples. (a) Sample 1; (b) sample 2
    Scratch sample
    • Table 1. Statistics of total radiation fluxes of seven ceramic tile samplesunit: V

      View table

      Table 1. Statistics of total radiation fluxes of seven ceramic tile samplesunit: V

      Type of ceramic tileTotal radiation flux for seven samplesStandard deviation
      #1#2#3#4#5#6#7#8
      a2.323302.355082.320562.351342.315232.329542.300822.322270.01808
      b2.010552.021782.014762.011092.016772.030022.042372.025060.01080
      c2.016832.013322.010622.022682.012002.008492.016092.045630.01191
      d1.948631.928891.969621.966641.970251.973921.972921.976760.01641
      e2.078912.052322.046132.056812.114972.075592.082322.121800.02786
      f1.860951.868111.874321.865791.905911.918891.935571.921430.02973
      g1.651881.659911.661251.676601.653731.643221.633271.643590.01335
    • Table 2. Total radiation fluxes of uncracked and cracked samples unit: V

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      Table 2. Total radiation fluxes of uncracked and cracked samples unit: V

      Crack typeSignalTotal radiation flux of cracked samples with different orientationsTotal radiation flux of uncracked samples
      1→22→33→44→1
      1S2.231652.226672.219482.197882.31696
      |Δ1|0.085310.090290.097480.11908
      2S2.188682.195482.227792.210272.31696
      |Δ1|0.128280.121480.089170.10669
    • Table 3. Total radiation fluxes of scratched samples with different depths and unscratched samples unit: V

      View table

      Table 3. Total radiation fluxes of scratched samples with different depths and unscratched samples unit: V

      Type of ceramic tileSignalTotal radiation flux of scratched samples with different depthsTotal radiation flux of unscratched samples
      L=5L=10L=15
      aS2.002771.990031.979572.01705
      |Δ2|0.014280.027020.03748
      dS2.061932.040582.022472.08423
      |Δ2|0.02230.043650.06176
      eS2.062352.048522.032552.07279
      |Δ2|0.010440.024270.04024
      fS1.661741.652061.644551.67433
      |Δ2|0.012590.022270.02978
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    Haoyi Ouyang, Wanjun Chen, Hai Li, Chuping Yang. Single Pixel Detection Theory of Flat Surface Reflectivity Anomaly[J]. Laser & Optoelectronics Progress, 2021, 58(12): 1212003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 18, 2020

    Accepted: Oct. 12, 2020

    Published Online: Jun. 22, 2021

    The Author Email: Li Hai (leehai361@scau.edu.cn), Yang Chuping (yangchp@scau.edu.cn)

    DOI:10.3788/LOP202158.1212003

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