Microelectronics, Volume. 52, Issue 6, 1044(2022)
A Novel Latchup-Immune Dual-Directional SCR with High Holding Voltage
[1] [1] VASHCHENKO V A. ESD design for analog circuits [C]// IEEE Int Conf Sol Sta Integr Circ Technol. 2010: 167-169.
[2] [2] VASHCHENKO V A, KINDT W, BEEK M T, et al. Implementation of 60 V tolerant dual direction ESD protection in 5 V BiCMOS process for automotive application [C]// Elec Overstress/Electrostatic Discharge Symp. 2004: 1-8.
[3] [3] LEE J H, PRABHU M, IYER N M, et al. Enhanced nFinFET ESD performance [C]// IEEE 39th Elec Overstress/Electrostatic Discharge Symp. Tucson, AZ, USA. 2017: 1-10.
[4] [4] WANG Z, SUN R, LIOU J J, et al. Optimized pMOS-triggered bidirectional SCR for low-voltage ESD protection applications [J]. IEEE Trans Elec Dev, 2014, 61(7): 2588-2594.
[5] [5] LIAO C, HUI C, LIU J, et al. Low-voltage triggering SCRs for ESD protection in a 0.35 μm SiGe BiCMOS process [C]// IEEE Int Nanoelec Conf. 2016.
[7] [7] WANG A Z H, TSAY C H. On a dual-polarity on-chip electrostatic discharge protection structure [J]. IEEE Trans Elec Dev, 2001, 48(5): 978-984.
[8] [8] DONG S. Novel capacitance coupling complementary dual-direction SCR for high-voltage ESD [J]. IEEE Elec Dev Lett, 2012, 33(5): 640-642.
[9] [9] LIANG, H, XU Q, ZHU L, et al. Design of a gate diode triggered SCR for dual-direction high-voltage ESD protection [J]. IEEE Elec Dev Lett, 2019, 40(2), 163-166
[10] [10] DU F, LIU Z, LIU J, et al. A compact and self-isolated dual-directional silicon controlled rectifier (SCR) for ESD applications [J]. IEEE Trans Dev Mater Reliab, 2019, 19(1): 169-175
[11] [11] JIANG Z W, CHEN S H, KER M D. Bi-directional SCR device with dual-triggered mechanism for ESD protection in extended-voltage-swing I/O application [C]// Int Conf Sol Sta Dev Mater. Sendai, Japan. 2009: 420-421.
Get Citation
Copy Citation Text
SUN Haonan, LI Haoliang, YANG Xiaonan. A Novel Latchup-Immune Dual-Directional SCR with High Holding Voltage[J]. Microelectronics, 2022, 52(6): 1044
Category:
Received: Oct. 28, 2021
Accepted: --
Published Online: Mar. 11, 2023
The Author Email: