Experimental observation of topologically protected defect states in silicon waveguide arrays

Tianying Lin; Ze Chen; Xiaopei Zhang; He Li; Xiaoping Liu; Haibin Lü

doi:10.3788/COL202018.051301

Chinese Optics Letters, Volume. 18, Issue 5, 051301(2020)

Experimental observation of topologically protected defect states in silicon waveguide arrays

Tianying Lin^1,2, Ze Chen^1,2, Xiaopei Zhang^1,2, He Li^1,2, Xiaoping Liu^1,2、*, and Haibin Lü^1,2、**

¹National Laboratory of Solid State Microstructures and College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China

²Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China

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Tianying Lin, Ze Chen, Xiaopei Zhang, He Li, Xiaoping Liu, Haibin Lü. Experimental observation of topologically protected defect states in silicon waveguide arrays[J]. Chinese Optics Letters, 2020, 18(5): 051301

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Paper Information

Category: Integrated Optics

Received: Dec. 30, 2019

Accepted: Jan. 16, 2020

Posted: Jan. 17, 2020

Published Online: Apr. 28, 2020

The Author Email: Xiaoping Liu (xpliu@nju.edu.cn), Haibin Lü (lvhaibin203@163.com)

DOI:10.3788/COL202018.051301

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