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Opto-Electronic Engineering, Volume. 33, Issue 12, 101(2006)

Extracting ellipses based on evaluation for elliptical profile error

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    [1] [1] P.LOVENITTI,William THOMPSON,Manmohan SINGH.Three-dimensional measurement using a single image[J].Optical Engineering,1996,35(5):1496-1502.

    [2] [2] LIU Shugui,HUANG Fengshan,Kai PENG.The modeling of portable 3D vision coordinates measuring system[J].SPIE,2005,5638:835-842.

    [3] [3] W.-Y.V.LEUNG,M.TALLON,R.G.LANE.Centroid estimation by model-fitting from undersampled wavefront sensing images[J].Optics Communications,2002,201:11-20.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Extracting ellipses based on evaluation for elliptical profile error[J]. Opto-Electronic Engineering, 2006, 33(12): 101

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    Paper Information

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    Received: Apr. 17, 2006

    Accepted: --

    Published Online: Nov. 14, 2007

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology