[1] [1] W. Burns, C. Chen, R. Moeller. Fiber-optic gryroscopes with broad-band sources. IEEE J. Lightwave Technol., 1983, 1(1)∶ 98~105

[2] [2] K. Takada, I. Yokohama, K. Chida et al.. New measurement system for fault location in optical wavelength devices based on an interferometric technique. Appl. Opt., 1987, 26(9)∶ 1603~1606

[3] [3] G. Xia, Z. Wu, J. Chen et al.. Studying semiconductor lasers with multi-mode rate equations. Appl. Opt., 1995, 34(9)∶ 1523~1527

[4] [4] Z. Wu, G. Xia, J. Chen et al.. Asymmetric longitudinal mode spectrum of Fabry-Perot seminconductor lasers. J. Opt. Commun., 1996, 17(2)∶ 74~78

[5] [5] G. Xia, Z. Wu, J. Chen et al.. Carrier deficit from nominal threshold density and mode suppression ratio of an above-threshold biased semiconductor laser. Opt. Lett., 1994, 19(10)∶ 731~733

[6] [6] J. Chen, D. Li, Y. Lu. Experimental and theoretical studies on monitored signals from semiconductor diodes undergoing antireflection coatings. Appl. Opt., 1991, 30(31)∶ 4554~4559

[7] [7] B. Luo, L. Wu, J. Chen et al.. Determination of wavelength dependence of the reflectivity at AR coated diode facets. IEEE Photon. Technol. Lett., 1993, 5(11)∶ 1279~1281

[8] [8] Wu Zhengmao, Xia Guangqiong, Wu Lan et al.. Effect of antireflection coatings on the peak wavelength of output spectrum from end facet of a semiconductor laser. Chinese J. Lasers, 1994, B3(6)∶ 495~499