Acta Photonica Sinica, Volume. 39, Issue 11, 2045(2010)
Shape Measurement Based on Phaseshifting Electronic Speckle Pattern Interferometry
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ZHAO Ruidong, SUN Ping. Shape Measurement Based on Phaseshifting Electronic Speckle Pattern Interferometry[J]. Acta Photonica Sinica, 2010, 39(11): 2045
Received: May. 18, 2010
Accepted: --
Published Online: Dec. 7, 2010
The Author Email: SUN Ping (sunpingmail@163.com)
CSTR:32186.14.