Acta Optica Sinica, Volume. 24, Issue 3, 393(2004)
A Flat-Field Spectrograph for Measuring 290～450 nm Spectrum
References(1)
[3] [3] Peckerar M C, Baker W D,Nagel D J et al.. X-ray sensitivity of a charge-coupled-device array. J. Appl. Phys., 1977, 48(6):2565～2569
Tools
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese]. A Flat-Field Spectrograph for Measuring 290～450 nm Spectrum[J]. Acta Optica Sinica, 2004, 24(3): 393
Paper Information
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20