Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Chinese Optics Letters, Volume. 10, Issue 7, 071202(2012)

Two-wavelength sinusoidal phase-modulating interferometer for nanometer accuracy measurement

Bofan Wang, Zhongliang Li, and Xiangzhao Wang
Author Affiliations
show less
AbstractGet PDF
References (14)
Cited By (3)
Tools
Paper Information
Topics
Cited By

Article index updated: Feb. 24, 2023

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
The article is cited by 3 article(s) from Web of Science.
Tools

Get Citation

Copy Citation Text

Bofan Wang, Zhongliang Li, Xiangzhao Wang, "Two-wavelength sinusoidal phase-modulating interferometer for nanometer accuracy measurement," Chin.Opt.Lett. 10, 071202 (2012)

Download Citation

EndNote(RIS)BibTexPlain Text
Set citation alerts for article
Save article for my favorites
Paper Information

Category: Instrumentation, measurement, and metrology

Received: Dec. 5, 2011

Accepted: Jan. 18, 2012

Published Online: Apr. 5, 2012

The Author Email:

DOI:10.3788/col201210.071202

Topics

laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology