Acta Optica Sinica, Volume. 43, Issue 3, 0312008(2023)

Lithography Hotspot Detection Method Based on Pre-trained VGG11 Model

Lufeng Liao1,2, Sikun Li1,2、*, and Xiangzhao Wang1,2、**
Author Affiliations
  • 1Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(10)
    Schematic of hotspot detection method based on convolutional neural network
    Workflow of the proposed method
    Diagram of VGG models' network architecture[31]
    Schematic of network architecture of the modified VGG11 model
    Model performance comparison of different pre-trained VGG models. (a) Accuracy; (b) recall; (c) precision; (d) F1 score
    Model performance comparison of different methods. (a) Accuracy; (b) recall; (c) precision; (d) F1 score
    • Table 1. Data composition of ICCAD 2012 benchmark suite

      View table

      Table 1. Data composition of ICCAD 2012 benchmark suite

      BenchmarkTraining dataTest data
      HotspotsNon-hotspotsHotspotsNon-hotspots
      Benchmark 1(B1)99340226319
      Benchmark 2(B2)17452584984146
      Benchmark 3(B3)909464318083541
      Benchmark 4(B4)9544521713386
      Benchmark 5(B5)262716412111
    • Table 2. Model performance comparison of different pre-trained VGG models

      View table

      Table 2. Model performance comparison of different pre-trained VGG models

      BenchmarkModelAccuracyRecallPrecisionF1 score

      Benchmark 1

      (B1)

      VGG110.9890.9870.9870.987
      VGG130.9610.9380.9680.953
      VGG160.9610.9420.9640.953
      VGG190.9580.9380.9590.949

      Benchmark 2

      (B2)

      VGG110.9840.9880.8790.930
      VGG130.9790.9880.8430.910
      VGG160.9720.9780.8070.884
      VGG190.9690.9560.7940.867

      Benchmark 3

      (B3)

      VGG110.9860.9920.9670.980
      VGG130.9840.9880.9660.977
      VGG160.9800.9890.9550.972
      VGG190.9640.9860.9160.950

      Benchmark 4

      (B4)

      VGG110.9920.9420.9180.930
      VGG130.9920.9320.9180.925
      VGG160.9920.9420.9050.923
      VGG190.9900.9270.8890.908

      Benchmark 5

      (B5)

      VGG110.9931.0000.7240.840
      VGG130.9931.0000.7240.840
      VGG160.9921.0000.7120.832
      VGG190.9901.0000.6770.808
      AverageVGG110.9890.9820.8950.933
      VGG130.9820.9690.8840.921
      VGG160.9790.9700.8690.913
      VGG190.9740.9610.8470.896
    • Table 3. Comparison of training time of different pre-trained VGG models

      View table

      Table 3. Comparison of training time of different pre-trained VGG models

      ModelVGG11VGG13VGG16VGG19
      Training time /s279317359497
    • Table 4. Model performance comparison of different methods

      View table

      Table 4. Model performance comparison of different methods

      BenchmarkMethodAccuracyRecallPrecisionF1 score

      Benchmark 1

      (B1)

      Ref.[23-0.9950.3240.489
      Case 10.9890.9870.9870.987
      Case 20.9870.9820.9870.984
      Case 30.9870.9820.9870.984

      Benchmark 2

      (B2)

      Ref.[23-0.9860.7020.820
      Case 10.9840.9880.8790.930
      Case 20.9820.9900.8640.923
      Case 30.9820.9880.8640.921

      Benchmark 3

      (B3)

      Ref.[23-0.9820.4430.640
      Case 10.9860.9920.9670.980
      Case 20.9850.9920.9650.978
      Case 30.9860.9920.9580.975

      Benchmark 4

      (B4)

      Ref.[23-0.9720.3550.520
      Case 10.9920.9420.9180.930
      Case 20.9930.9370.9320.935
      Case 30.9950.9690.9540.961

      Benchmark 5

      (B5)

      Ref.[23-0.9800.5490.635
      Case 10.9931.0000.7240.840
      Case 20.9931.0000.7500.857
      Case 30.9921.0000.7120.832
      AverageRef.[24-0.9800.3000.458
      Ref.[23-0.9830.4750.635
      Case 10.9890.9820.8950.933
      Case 20.9880.9800.9000.935
      Case 30.9880.9860.8950.935
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    Lufeng Liao, Sikun Li, Xiangzhao Wang. Lithography Hotspot Detection Method Based on Pre-trained VGG11 Model[J]. Acta Optica Sinica, 2023, 43(3): 0312008

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 6, 2022

    Accepted: Aug. 31, 2022

    Published Online: Feb. 13, 2023

    The Author Email: Li Sikun (lisikun@siom.ac.cn), Wang Xiangzhao (wxz26267@siom.ac.cn)

    DOI:10.3788/AOS221429

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