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Spectroscopy and Spectral Analysis, Volume. 32, Issue 4, 993(2012)

Study of the Raman-AFM System for Simultaneous Measurements of Raman Spectrum and Micro/Nano-Structures

SHI Bin*... ZHANG Hai-jun, WU Lan and ZHANG Dong-xian |Show fewer author(s)
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    SHI Bin, ZHANG Hai-jun, WU Lan, ZHANG Dong-xian. Study of the Raman-AFM System for Simultaneous Measurements of Raman Spectrum and Micro/Nano-Structures[J]. Spectroscopy and Spectral Analysis, 2012, 32(4): 993

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    Paper Information

    Received: Aug. 11, 2011

    Accepted: --

    Published Online: Apr. 16, 2012

    The Author Email: Bin SHI (shibin1988@zju.edu.cn)

    DOI:10.3964/j.issn.1000-0593(2012)04-0993-04

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology