Spectroscopy and Spectral Analysis, Volume. 32, Issue 4, 993(2012)

Study of the Raman-AFM System for Simultaneous Measurements of Raman Spectrum and Micro/Nano-Structures

SHI Bin*, ZHANG Hai-jun, WU Lan, and ZHANG Dong-xian
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    This paper proposes a novel technique of Raman-atomic force microscopy (AFM) combining micro region Raman spectroscopy and AFM imaging. An in-situ probe unit which can simultaneously realize the detection of Raman spectrum and the measurement of AFM image was designed, and a related Raman-AFM system was constructed. Using this system, some experiments were carried out to acquire micro region Raman spectra and AFM images of ZnO nano-particle and TiO2 film. The results show that the Raman spectra of both samples are in agreement with theoretical vaues, and the AFM images represent their micro/nano-structures quite well. These researches prove the feasibility of the Raman-AFM technique which has the potential of being widely applied in the fields of Raman spectroscopy and micro/nano-technology.

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    SHI Bin, ZHANG Hai-jun, WU Lan, ZHANG Dong-xian. Study of the Raman-AFM System for Simultaneous Measurements of Raman Spectrum and Micro/Nano-Structures[J]. Spectroscopy and Spectral Analysis, 2012, 32(4): 993

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    Paper Information

    Received: Aug. 11, 2011

    Accepted: --

    Published Online: Apr. 16, 2012

    The Author Email: Bin SHI (shibin1988@zju.edu.cn)

    DOI:10.3964/j.issn.1000-0593(2012)04-0993-04

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