Optics and Precision Engineering, Volume. 10, Issue 5, 523(2002)

Thickness effects on the microstructure, ferroelectric and dielectric properties of highly (111) oriented Pb(Zr0.53Ti0.47)O3 thin films

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    [4] [4] Sun C L, Chen S Y, Tang M Y,et al. Characteristc of Pb(Zr0.53Ti0.47)O3 on metal and Al2O3/Si substrates[J].J. Electrochem. Soc,2001,148:203-206.

    [5] [5] Yang Y S, Lee S J, Yi S, et al. Schottky barriers effects in the photocurrent of sol-gel derived lead zirconate titanate thin films[J].App. Phys.Lett,2000,76:774-784.

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    [9] [9] Kim D-H, Na J S, Rhee S-W. J. Metallogranic chemical vapor deposition of Pb(Zr,Ti)O3 film s using a single mixture of metallogranic precursors[J].Electrochem. Soc.2001,148:668-676.

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    [15] [15] Hung Z, Zhang Q, Whatmore R W.Low temperature crystallization of lead zirconate titanate thin films by a sol-gel method[J]. J. Appl. Phys,1999,85:7355-7359.

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    [in Chinese], [in Chinese], [in Chinese]. Thickness effects on the microstructure, ferroelectric and dielectric properties of highly (111) oriented Pb(Zr0.53Ti0.47)O3 thin films[J]. Optics and Precision Engineering, 2002, 10(5): 523

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    Received: Oct. 16, 2001

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    Published Online: Sep. 18, 2007

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