Infrared and Laser Engineering, Volume. 52, Issue 12, 20230414(2023)
Research on precise measurement of phonon-polariton interference fringe period
Fig. 1. Self-traceable grating structure image. (a) 2D plane image; (b) 3D structural image
Fig. 3. (a) nano-FTIR spectra of hBN/self-traceable grating structure; (b) nano-FTIR spectra of hBN/self-traceable grating structure at the grating ridge and grating groove
Fig. 4. (a) Sample testing equipment, BRUKER Company’s nanoscale infrared spectrometer Anasys nanoIR3-s, with 10 nm spatial resolution; (b) Near-field optical imaging of the sample, where the blue color represents the region of the hBN/self-traceable grating structure, and the yellow color represents the region of the self-traceable grating; (c) Atomic Force Microscopy imaging of the surface structure of the sample
Fig. 5. A comparative study of AFM and SNOM images of hBN/grating composite structures with different scanning ranges. (a)-(c) AFM imaging of the sample surface morphology (The imaging sizes are 1 µm×1 µm, 5 µm×5 µm, and 10 µm×10 µm, respectively); (d)-(f) Near-field optical imaging of the sample corresponding to the previous images (The imaging sizes are the same as mentioned above)
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Zhijun Yin, Zhenxing Wang, Quan Li, Renkang Song, Xiao Deng, Lihua Lei. Research on precise measurement of phonon-polariton interference fringe period[J]. Infrared and Laser Engineering, 2023, 52(12): 20230414
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Received: Jul. 20, 2023
Accepted: --
Published Online: Feb. 23, 2024
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