Infrared and Laser Engineering, Volume. 52, Issue 12, 20230414(2023)

Research on precise measurement of phonon-polariton interference fringe period

Zhijun Yin1...2,3,4,5, Zhenxing Wang1,2,3,4,5, Quan Li1,2,3,4,5, Renkang Song1,2,3,4,5, Xiao Deng1,2,3,4,5 and Lihua Lei6 |Show fewer author(s)
Author Affiliations
  • 1School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
  • 2Institute of Precision Optical Engineering, Tongji University, Shanghai 200092, China
  • 3MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China
  • 4Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China
  • 5Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications, Shanghai 200092, China
  • 6Shanghai Institute of Measurement and Testing Technology, Shanghai 201203, China
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    Figures & Tables(6)
    Self-traceable grating structure image. (a) 2D plane image; (b) 3D structural image
    Schematic diagram of hBN/self-traceable grating structure
    (a) nano-FTIR spectra of hBN/self-traceable grating structure; (b) nano-FTIR spectra of hBN/self-traceable grating structure at the grating ridge and grating groove
    (a) Sample testing equipment, BRUKER Company’s nanoscale infrared spectrometer Anasys nanoIR3-s, with 10 nm spatial resolution; (b) Near-field optical imaging of the sample, where the blue color represents the region of the hBN/self-traceable grating structure, and the yellow color represents the region of the self-traceable grating; (c) Atomic Force Microscopy imaging of the surface structure of the sample
    A comparative study of AFM and SNOM images of hBN/grating composite structures with different scanning ranges. (a)-(c) AFM imaging of the sample surface morphology (The imaging sizes are 1 µm×1 µm, 5 µm×5 µm, and 10 µm×10 µm, respectively); (d)-(f) Near-field optical imaging of the sample corresponding to the previous images (The imaging sizes are the same as mentioned above)
    • Table 1. Measurement of interference fringe period in images with different scanning ranges

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      Table 1. Measurement of interference fringe period in images with different scanning ranges

      Scanning range/µm2Image analysis and period fitting/nmImage analysis of self-traceable grating/nm
      1×1264261.28
      5×5254260.35
      10×10257261.41
      S. D.40.34
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    Zhijun Yin, Zhenxing Wang, Quan Li, Renkang Song, Xiao Deng, Lihua Lei. Research on precise measurement of phonon-polariton interference fringe period[J]. Infrared and Laser Engineering, 2023, 52(12): 20230414

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    Paper Information

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    Received: Jul. 20, 2023

    Accepted: --

    Published Online: Feb. 23, 2024

    The Author Email:

    DOI:10.3788/IRLA20230414

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