Journal of Terahertz Science and Electronic Information Technology , Volume. 20, Issue 6, 535(2022)

Review of radiation effects on GaN HEMT devices

LYU Hanghang1,2、*, CAO Yanrong1,2, MA Maodan1,2, ZHANG Longtao1,2, REN Chen1,2, WANG Zhiheng1,2, LYU Ling1, ZHENG Xuefeng3, and MA Xiaohua3
Author Affiliations
  • 1[in Chinese]
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    References(49)

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    LYU Hanghang, CAO Yanrong, MA Maodan, ZHANG Longtao, REN Chen, WANG Zhiheng, LYU Ling, ZHENG Xuefeng, MA Xiaohua. Review of radiation effects on GaN HEMT devices[J]. Journal of Terahertz Science and Electronic Information Technology , 2022, 20(6): 535

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    Paper Information

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    Received: Jan. 7, 2022

    Accepted: --

    Published Online: Aug. 15, 2022

    The Author Email: Hanghang LYU (ymshh@stu.xidian.edu.cn)

    DOI:10.11805/tkyda2022012

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