Infrared Technology, Volume. 46, Issue 4, 483(2024)

Design of Infrared Thermal Wave Image Defect Detection System Based on LabVIEW

Dan TAN1, Zhijie ZHANG1、*, Luxiang WANG1, and Wuliang YIN1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(9)

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    [3] [3] KANG Shuang, CHEN Changzheng, LIU Shi, et al. Morphological infrared image defect detection based on optimal multi-scale set[J]. Acta Solar-Energy Sinica, 2022, 43(6): 145-152.

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    [5] [5] GUO Hui, SHEN Yong, YUE Linfeng, et al. Measurement of geometric angle of twist drill based on LabVIEW [J]. Tool Technology, 2014, 48(1): 82-85.

    [6] [6] ZHENG Zhonghua, SHI Xinming, LIU Weibin, et al. Research on SIM card slot defect detection system based on Labview machine vision[J]. Journal of Dongguan University of Technology, 2021, 28(5): 50-56.

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    [9] [9] WANG Xueqing, LIU Jintao, WEI Yabo, et al. Research on defect detection of Plexiglass based on machine vision and LabVIEW[J]. Journal of Jilin Institute of Chemical Technology, 2021, 38(1): 68-73.

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    TAN Dan, ZHANG Zhijie, WANG Luxiang, YIN Wuliang. Design of Infrared Thermal Wave Image Defect Detection System Based on LabVIEW[J]. Infrared Technology, 2024, 46(4): 483

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    Paper Information

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    Received: Apr. 12, 2023

    Accepted: --

    Published Online: Sep. 2, 2024

    The Author Email: ZHANG Zhijie (zhangzhijie@nuc.edu.cn)

    DOI:

    CSTR:32186.14.

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