Electronics Optics & Control, Volume. 22, Issue 12, 112(2015)
Remaining Lifetime Prediction by Integrating Stochastic Degradation Process with Hazard Rate
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LUO Yang, HU Chang-hua, SI Xiao-sheng, ZHANG Zheng-xin, LIU Hao. Remaining Lifetime Prediction by Integrating Stochastic Degradation Process with Hazard Rate[J]. Electronics Optics & Control, 2015, 22(12): 112
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Received: Dec. 23, 2014
Accepted: --
Published Online: Dec. 18, 2015
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