Semiconductor Optoelectronics, Volume. 43, Issue 6, 1119(2022)

Design of High-speed Column-level ADC for Image Sensor Based on SAR-SS Architecture

LIU Yufan... LIU Jionghan, CHENG Yu, Qu Yang, ZHONG Guoqiang and CHANG Yuchun |Show fewer author(s)
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    References(8)

    [1] [1] Tang F, Cao Y, Zhao X. Single slope/SAR column-parallel ADC with mixed-signal error correction[C] //Proc. Inter. Midwest Symp. on Circuits and Systems (MWSCAS), 2013: 237-240.

    [2] [2] Tang F, Chen D G, Wang B, et al. Low-power CMOS image sensor based on column-parallel single-slope/SAR quantization scheme[J]. IEEE Trans. on Electron Devices, 2013, 60(8): 2561-2566.

    [3] [3] Kim M, Hong S, Kwon O. An area-efficient and low-power 12-b SAR/single-slope ADC without calibration method for CMOS image sensors[J]. IEEE Trans. on Electron Devices, 2016, 63(9): 3599-3604.

    [4] [4] Martin-Gonthier P, Magnan P. CMOS image sensor noise analysis through noise power spectral density including under sampling effect due to readout sequence[J]. IEEE Trans. on Electron Devices, 2014, (61)8: 2834-2842.

    [5] [5] Cho N, Song B, Kim K, et al. A VGA CMOS image sensor with 11bit column parallel single-slope ADCs[C]// Proc. Inter. SoC Design Conf. (ISOCC), 2010: 25-27.

    [6] [6] Razavi B. The StrongARM latch[J]. IEEE Solid-State Circuits Magazine, 2015, 2(7): 12-17.

    [7] [7] Liu G, Yu N, Zhang H, et al. A fully differential SAR/single-slope ADC for CMOS imager sensor[C]// Proc. Inter. Conf. on Electron Devices and Solid-State Circuits (EDSSC), 2019: 1-3.

    [8] [8] Kim H, Hwang S, Chung J, et al. A dual-imaging speed-enhanced CMOS image sensor for real-time edge image extraction[J]. IEEE J. of Solid-State Circuits, 2017, 52(9): 2488-2497.

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    LIU Yufan, LIU Jionghan, CHENG Yu, Qu Yang, ZHONG Guoqiang, CHANG Yuchun. Design of High-speed Column-level ADC for Image Sensor Based on SAR-SS Architecture[J]. Semiconductor Optoelectronics, 2022, 43(6): 1119

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    Paper Information

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    Received: Jun. 15, 2022

    Accepted: --

    Published Online: Jan. 27, 2023

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2022061503

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