Electronics Optics & Control, Volume. 23, Issue 2, 87(2016)
Reliability Assessment of Nonlinear Accelerated Degradation Based on Wiener Process
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CAI Zhong-yi, CHEN Yun-xiang, CHE Fei, ZHANG Lei. Reliability Assessment of Nonlinear Accelerated Degradation Based on Wiener Process[J]. Electronics Optics & Control, 2016, 23(2): 87
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Received: Jan. 26, 2015
Accepted: --
Published Online: Mar. 25, 2016
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