Optoelectronics Letters, Volume. 14, Issue 3, 214(2018)

Structure and photoluminescence properties of InN films grown on porous silicon by MOCVD

Jun WANG and Hong-yan and ZHANG
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  • School of Physical Science and Technology, Xinjiang University, Urumqi 830046, China
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    WANG Jun, and ZHANG Hong-yan. Structure and photoluminescence properties of InN films grown on porous silicon by MOCVD[J]. Optoelectronics Letters, 2018, 14(3): 214

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    Paper Information

    Category: Materials

    Received: Jan. 16, 2017

    Accepted: --

    Published Online: Sep. 15, 2018

    The Author Email:

    DOI:10.1007/s11801-017-7013-x

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