Infrared and Laser Engineering, Volume. 50, Issue 11, 20210105(2021)

Sub-aperture stitching deflectometric testing technology for optical surfaces

Chao Xiang1... Daodang Wang1,2, Jinchao Dou1, Ming Kong1, Lu Liu1 and Xinke Xu1 |Show fewer author(s)
Author Affiliations
  • 1College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou 310018, China
  • 2Wenzhou Research Institute of Zhejiang University, Wenzhou 325006, China
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    Figures & Tables(8)
    Schematic diagram of optical deflectometric system for sub-aperture stitching measurement
    Diagram of two sub-apertures and their overlapped region
    Surface data and its global position for various sub-apertures in simulation
    Stitched surfaces and residual errors in simulation. (a) Stitched surface with weighted-fusion method; (b) Nominal surface; (c) Residual error between (a) and (b); (d) Residual error between stitched surface based on mean calculation method and nominal surface
    Experimental setup of optical deflectometric system for sub-aperture stitching measurement
    Distorted fringes patterns acquired with CCD camera
    Measured surface and its global position for various sub-apertures in experiment
    Full-aperture measurement results and residual errors for a reflective lampshade in experiment. (a) Measurement result with weighted-fusion method; (b) Measurement result with a laser scanner; (c) Residual error between (a) and (b); (d) Residual error between measurement result stitched with mean calculation method and that with laser scanner
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    Chao Xiang, Daodang Wang, Jinchao Dou, Ming Kong, Lu Liu, Xinke Xu. Sub-aperture stitching deflectometric testing technology for optical surfaces[J]. Infrared and Laser Engineering, 2021, 50(11): 20210105

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    Paper Information

    Category: Photoelectric measurement

    Received: Feb. 16, 2021

    Accepted: --

    Published Online: Dec. 7, 2021

    The Author Email:

    DOI:10.3788/IRLA20210105

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