Infrared and Laser Engineering, Volume. 50, Issue 11, 20210105(2021)
Sub-aperture stitching deflectometric testing technology for optical surfaces
Fig. 1. Schematic diagram of optical deflectometric system for sub-aperture stitching measurement
Fig. 3. Surface data and its global position for various sub-apertures in simulation
Fig. 4. Stitched surfaces and residual errors in simulation. (a) Stitched surface with weighted-fusion method; (b) Nominal surface; (c) Residual error between (a) and (b); (d) Residual error between stitched surface based on mean calculation method and nominal surface
Fig. 5. Experimental setup of optical deflectometric system for sub-aperture stitching measurement
Fig. 7. Measured surface and its global position for various sub-apertures in experiment
Fig. 8. Full-aperture measurement results and residual errors for a reflective lampshade in experiment. (a) Measurement result with weighted-fusion method; (b) Measurement result with a laser scanner; (c) Residual error between (a) and (b); (d) Residual error between measurement result stitched with mean calculation method and that with laser scanner
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Chao Xiang, Daodang Wang, Jinchao Dou, Ming Kong, Lu Liu, Xinke Xu. Sub-aperture stitching deflectometric testing technology for optical surfaces[J]. Infrared and Laser Engineering, 2021, 50(11): 20210105
Category: Photoelectric measurement
Received: Feb. 16, 2021
Accepted: --
Published Online: Dec. 7, 2021
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