Fig. 1. (a) Schematic of the experimental setup. (b) Image of far-field light intensity distribution of the excited LP₀₁ mode beam. (c) Image of far-field light intensity distribution of the excited LP₁₁ mode beam. (d) Optical micrographic image of flat-facet fiber probe.

Fig. 2. Tapered fiber probe traps particles in the experiment. (a) Particle trapping was performed using an LP₁₁ mode beam excited by a 650 nm laser source. (b) Particle trapping was performed using an LP₀₁ mode beam excited by a 980 nm laser source. (The scale bars in the figure are all 4 µm.)

Fig. 3. (a)–(d) LP₁₁ mode beam excited by a 650 nm laser passes through the electric field of the flat-facet fiber probe, details of the electric field distribution, applying a force on the particle in the x axis and a force on the particle along the y-axis direction. (e)–(h) LP₀₁ mode beam excited by a 980 nm laser passes through the electric field of the flat-facet fiber probe, details of the electric field distribution, applying a force on the particle in the x axis and a force on the particle along the y-axis direction.

Fig. 4. Manipulation of particles in the x–y plane. (The scale bars in the figure are all 4 µm.)

Fig. 5. (a) Trajectory of particles being emitted when the 650 nm and 980 nm laser sources are turned on simultaneously. (The scale bars in the figure are all 4 µm.) (b) The horizontal position of the particle as a function of time.

Fig. 6. (a) Particle emission trajectory when only the 980 nm laser source is turned on. (The scale bars in the figure are all 4 µm.) (b) The horizontal position of the particle as a function of time.

Fig. 7. First transport process of the particle. (The scale bars in the figure are all 4 µm.)

Fig. 8. Second transport process of the particles. (The scale bars in the figure are all 4 µm.)