[1] Yuan Q, Ji W, Gao Z S. Geometric characteristics and error analysis of standard spherical lens[J]. Journal of Applied Optics, 41, 857-867(2020).

[2] Hu Q W, Gao Z S, Yuan Q et al. Synchronous phase-shifting microscopic interference focal detection method based on wave aberration criteria[J]. Journal of Applied Optics, 42, 703-708(2021).

[3] Han S Z, Yang D, Hu X N et al. Micro-displacement measurement based on interference of vortex beams and plane wave[J]. Optics and Precision Engineering, 30, 2058-2066(2022).

[4] Hu X N, Yang D, Yang Z M et al. Method and system for precision displacement measurement with interference of conjugated vortex beams[J]. Acta Optica Sinica, 43, 0212001(2023).

[5] Zhang J P, Gao F, Li B. Transient interferometry of ultra precision surface based on small hole point diffraction[J]. Acta Photonica Sinica, 51, 0412004(2022).

[6] Zhu R H, Sun Y, Shen H. Progress and prospect of optical freeform surface measurement[J]. Acta Optica Sinica, 41, 0112001(2021).

[7] Liu J Q, Liu L, Liu L et al. Wavelength calibration of ultra-high resolution Brillouin spectrometer[J]. Acta Optica Sinica, 40, 2030001(2020).

[8] Sena A W, Hapiddin A, Syahadi M et al. Optical wavelength meter calibration using iodine stabilized He-Ne laser by direct measurement method[J]. Procedia Engineering, 170, 363-368(2017).

[9] Sheng H, Hua J W, Xia X et al. Design of digital frequency multiplier for near infrared and visible light Fourier transform spectrometer[J]. Infrared, 35, 29-33, 41(2014).

[10] Wang H B. Research on in-orbit spectral calibration and polarization correction technology of visible/near-infrared pushbroom imaging spectrometer[D], 8-20(2016).

[11] Yin Y. Research on high precision CCD circuit system of portable Raman spectrometer[D], 3-13(2014).

[12] Xu G C, Liu W H. A high precision spectrometer[P].

[13] Gwyn S, Watson S, Slight T et al. Dynamic device characteristics and linewidth measurement of InGaN/GaN laser diodes[J]. IEEE Photonics Journal, 13, 1500510(2020).

[14] Ke X, Deng L W. Linewidth of mutually injection-locked semiconductor lasers in weak coupling regime[J]. Chinese Journal of Lasers, 49, 0301001(2022).

[15] Blume G, Schiemangk M, Pohl J et al. Narrow linewidth of 633-nm DBR ridge-waveguide lasers[J]. IEEE Photonics Technology Letters, 25, 550-552(2013).

[16] Shi Z M, Boyd R W, Camacho R M et al. Slow-light Fourier transform interferometer[J]. Physical Review Letters, 99, 240801(2007).

[17] Wang B B. Measurement of narrow linewidth laser based on delayed non-zero frequency self-heterodyne method[J]. New Generation of Information Technology, 5, 50-52(2022).

[18] Zhi Y Z, Feng L S, Lei M. Delay self-heterodyne measurement of narrow linewidth laser frequency drift characteristic[J]. Optik, 125, 3124-3126(2014).

[19] Zhang N, Rao W, Meng Z et al. Linewidth study of the frequency-modulated laser based on the delayed self-heterodyne scheme[J]. Optics & Laser Technology, 45, 267-271(2013).

[20] Zhou Q, Qin J, Xie W L et al. Dynamic frequency-noise spectrum measurement for a frequency-swept DFB laser with short-delayed self-heterodyne method[J]. Optics Express, 23, 29245-29257(2015).

[21] Liu S, Li H Z, Liu L et al. Laser frequency noise power spectral density measurement technology and its application to resonant optical fiber gyroscope[J]. Acta Optica Sinica, 41, 1306010(2021).

[22] Wu Y, Deng L H, Yang K Y et al. Narrow linewidth external cavity laser capable of high repetition frequency tuning for FMCW LiDAR[J]. IEEE Photonics Technology Letters, 34, 1123-1126(2022).

[23] Fomiryakov E, Kharasov D, Nikitin S et al. New approach to laser characterization using delayed self-heterodyne interferometry[J]. Journal of Lightwave Technology, 39, 5191-5196(2021).

[24] Mercer L B. 1/f frequency noise effects on self-heterodyne linewidth measurements[J]. Journal of Lightwave Technology, 9, 485-493(1991).

[25] Huang S H, Zhu T, Cao Z Z et al. Laser linewidth measurement based on amplitude difference comparison of coherent envelope[J]. IEEE Photonics Technology Letters, 28, 759-762(2016).

[26] Wang Z H, Ke C J, Zhong Y B et al. Ultra-narrow-linewidth measurement utilizing dual-parameter acquisition through a partially coherent light interference[J]. Optics Express, 28, 8484-8493(2020).

[27] He Y X, Hu S L, Liang S et al. High-precision narrow laser linewidth measurement based on coherent envelope demodulation[J]. Optical Fiber Technology, 50, 200-205(2019).

[28] Xue M Y, Zhao J N. Laser linewidth measurement based on long and short delay fiber combination[J]. Optics Express, 29, 27118-27126(2021).

[29] Gao J, Jiao D D, Liu J et al. Laser linewidth measurement based on recirculating self-heterodyne method with short fiber[J]. Acta Optica Sinica, 41, 0712002(2021).

[30] Zhao Z A, Bai Z X et al. Narrow laser-linewidth measurement using short delay self-heterodyne interferometry[J]. Optics Express, 30, 30600-30610(2022).

[31] Richter L, Mandelberg H, Kruger M et al. Linewidth determination from self-heterodyne measurements with subcoherence delay times[J]. IEEE Journal of Quantum Electronics, 22, 2070-2074(1986).

[32] Cui M B, Huang J G, Yang X L. Review on methods for laser linewidth measurement[J]. Laser & Optoelectronics Progress, 58, 0900005(2021).

[33] Di Domenico G, Schilt S, Thomann P. Simple approach to the relation between laser frequency noise and laser line shape[J]. Applied Optics, 49, 4801-4807(2010).

[34] Chen M, Meng Z, Wang J F et al. Ultra-narrow linewidth measurement based on Voigt profile fitting[J]. Optics Express, 23, 6803-6808(2015).