Analysis of Near-Infrared Polarization Characteristics of Typical Satellite Surface Materials

Hongyi Chen; Yingchao Li

doi:10.3788/LOP202158.1929001

Laser & Optoelectronics Progress, Volume. 58, Issue 19, 1929001(2021)

Analysis of Near-Infrared Polarization Characteristics of Typical Satellite Surface Materials

Hongyi Chen^1,2 and Yingchao Li^2、*

Author Affiliations

¹School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun , Jilin 130022, China

²Jilin Province Key Laboratory of Space Optoelectronics Technology, Changchun University of Science and Technology, Changchun , Jilin 130022, China

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Figures & Tables(8)

Fig. 1. Angular relationship of microfacet model

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Fig. 2. Simulation comparison curves of DOP under different materials. (a) Aluminium; (b) black paint

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Fig. 3. Experimental setup

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Fig. 4. Acquisition device in polarization state measuring instrument

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Fig. 5. Polarization measurement curves of different systems

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Fig. 6. Polarization distribution characteristics of each material at 30° zenith angle. (a) Solar panel; (b) polyimide; (c) #54 black back plate; (d) aluminum

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Table 1. Comparison results of complex refractive index inversion for aluminum and black paint materials
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Table 1. Comparison results of complex refractive index inversion for aluminum and black paint materials
Material Truth Reference Estimation
$n$ $k$ $n$ $k$ $n$ $k$
Aluminum 1.240 6.6000 1.370 3.9700 1.231 6.5740
Black paint 1.405 0.2289 1.460 1.3200 1.429 0.2398

Table 2. Parametric inversion results of typical satellite surface materials

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Table 2. Parametric inversion results of typical satellite surface materials

Material	$σ$	$n$	$k$	$k_{s}$	$ρ$	Adaptability /%
Aluminum	0.207	1.5814	15.569	5.139	0.115	2.44
Solar panel	0.102	3.4687	0.002	1.206	0.186	3.68
Polyimide	0.081	1.6098	0.001	1.903	0.232	3.72
#54 black back plate	0.667	1.6010	2.168	12.473	0.034	4.91

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Hongyi Chen, Yingchao Li. Analysis of Near-Infrared Polarization Characteristics of Typical Satellite Surface Materials[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1929001

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