Optics and Precision Engineering, Volume. 30, Issue 2, 160(2022)

High reliability image storage electronics system of Tianwen-1 high-resolution camera

Yunfeng HE1... Dong WANG1,*, Zheng WANG1,2, Hainan GUAN1, Bowei ZHANG1 and Dejie YAN1 |Show fewer author(s)
Author Affiliations
  • 1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun30033, China
  • 2Key Laboratory of Lunar and Deep Space Exploration, Chinese Academy of Sciences, Beijing100101, China
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    Figures & Tables(12)
    Block diagram of Image storage electronics system
    Block diagram of K9F8G08U0M
    NAND Flash four level pipeline programming operation
    Image storage channel logical layer and physical layer mapping
    Hamming calibration flow chart
    Image storage and processing electronics system of high resolution camera
    Results of experimentation in the system
    12×4 bit image 1 bit error correction Chipscope timing sequence
    • Table 1. Line period and line frequency of CCD detector

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      Table 1. Line period and line frequency of CCD detector

      CCDH/kmVg/(km·s-1T/msfL/kHz
      全色2654.050.1238.1
      彩色2654.050.4922.03
    • Table 2. 12×4 bit row and line check table

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      Table 2. 12×4 bit row and line check table

      数据1RP3RP2RP1RP0Bit11Bit10Bit9Bit8Bit7Bit6Bit5Bit4Bit3Bit2Bit1Bit0RP0RP2
      数据2CP3CP2CP1CP0Bit11Bit10Bit9Bit8Bit7Bit6Bit5Bit4Bit3Bit2Bit1Bit0RP1
      数据3CP7CP6CP5CP4Bit11Bit10Bit9Bit8Bit7Bit6Bit5Bit4Bit3Bit2Bit1Bit0RP0RP3
      数据40000Bit11Bit10Bit9Bit8Bit7Bit6Bit5Bit4Bit3Bit2Bit1Bit0RP1
      CP1CP0CP1CP0CP1CP0CP1CP0CP1CP0CP1CP0
      CP3CP2CP3CP2CP3CP2
      CP4CP5CP4
      CP7CP6
    • Table 3. Corresponding relationship between the row check code and row number when 1 bit error occurs

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      Table 3. Corresponding relationship between the row check code and row number when 1 bit error occurs

      行号RP3~RP0 H
      15
      26
      39
      4A
    • Table 4. Corresponding relationship between the column check code and column number when 1bit error occurs

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      Table 4. Corresponding relationship between the column check code and column number when 1bit error occurs

      列号CP7~CP0 H列号CP7~CP0 H
      155995
      2561096
      3591199
      45A129A
      56513A5
      66614A6
      76915A9
      86A16AA
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    Yunfeng HE, Dong WANG, Zheng WANG, Hainan GUAN, Bowei ZHANG, Dejie YAN. High reliability image storage electronics system of Tianwen-1 high-resolution camera[J]. Optics and Precision Engineering, 2022, 30(2): 160

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    Paper Information

    Received: Sep. 18, 2020

    Accepted: --

    Published Online: Mar. 4, 2022

    The Author Email: WANG Dong (wangd@ciomp.ac.cn)

    DOI:10.37188/OPE.20223002.0160

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