Acta Physica Sinica, Volume. 69, Issue 14, 146101-1(2020)
Fig. 1. Resistance
Fig. 2. Failure time
Fig. 3. The high-resolution transmission electron microscopy images (a) (b) and selected area electron diffraction diagrams (c) (d) of section for [GT(7 nm)/ZS(3 nm)]5 multilayer composite film: (a), (c) Amorphous; (b), (d) crystalline.
Fig. 4. (a) The cross section diagram of PCM devices cell; the curves of (b)
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Xiao-Qin Zhu, Yi-Feng Hu.
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Received: Apr. 6, 2020
Accepted: --
Published Online: Dec. 28, 2020
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