Laser & Optoelectronics Progress, Volume. 56, Issue 6, 063201(2019)
Ultrafast Carrier Dynamics in n-Type and Semi-Insulating 6H-SiC Crystals
The ultrafast transient absorption spectroscopy of interband excitation is utilized to evaluate the ultrafast carrier recombination dynamics in the conductive (n-type) nitrogen (N)-doped and semi-insulating (SI) vanadium (V)-doped 6H-SiC wafers. The carrier relaxation of n-type 6H-SiC with carrier lifetime more than 10 ns is dominated by indirect recombination through N impurities and/or inherent defects. Compared with the n-type 6H-SiC, the V-doped one has a pronounced modulation of transient absorption, resulting from an additional carrier recombination process caused by the carrier trapping of V deep levels. The carrier-trapping with a lifetime of about 160 ps is more than two orders of magnitude faster than the indirect recombination. With a simplified energy level model and the global analysis, the carrier recombination mechanism is investigated and the carrier lifetime of 6H-SiC is determined accurately.
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Yao Nie, Youyun Wang, Xueqin Wu, Yu Fang. Ultrafast Carrier Dynamics in n-Type and Semi-Insulating 6H-SiC Crystals[J]. Laser & Optoelectronics Progress, 2019, 56(6): 063201
Category: Ultrafast Optics
Received: Sep. 25, 2018
Accepted: Oct. 10, 2018
Published Online: Jul. 30, 2019
The Author Email: Fang Yu (yufang@usts.edu.cn)