Acta Optica Sinica, Volume. 40, Issue 5, 0512003(2020)

Three-Dimensional Shape Measurement Method of High-Reflective Surfaces Based on Adaptive Fringe-Pattern

Wei Feng*, Shaojing Tang, Xiaodong Zhao, and Daxing Zhao
Author Affiliations
  • Hubei Key Laboratory of Modern Manufacturing Quality Engineering, School of Mechanical Engineering, Hubei University of Technology, Wuhan, Hubei 430068, China
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    Figures & Tables(12)
    Schematic diagram of adaptive fringe projection technology
    Flow chart of adaptive fringe projection technology
    Schematic diagram of coordinate matching between projector and camera
    Adaptive fringe projection measurement system
    Schematic diagram of synthetic image process
    Contrast map of fringe projection effect. (a) Conventional method; (b) adaptive fringe projection method
    Flow chart of heterodyne multi-frequency phase-shift method
    Partial phase unwrapping
    Comparison of three-dimensional reconstruction effect. (a) Conventional method; (b) adaptive fringe projection method
    Three-dimensional point cloud depth map. (a) Conventional method; (b) adaptive fringe projection method
    • Table 1. Evaluation and analysis of point cloud by conventional method

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      Table 1. Evaluation and analysis of point cloud by conventional method

      DirectionMaximal value /mmAverage error /mmStandard deviation /mm
      Negative direction-3.9525-0.45870.4720
      Absolute direction3.95250.00880.0843
      Forward direction3.82430.00430.0544
    • Table 2. Evaluation and analysis of point cloud by proposed method

      View table

      Table 2. Evaluation and analysis of point cloud by proposed method

      DirectionMaximal value /mmAverage error /mmStandard deviation /mm
      Negative direction-0.9415-0.31160.1994
      Absolute direction0.94150.00140.0239
      Forward direction0.81500.00070.0166
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    Wei Feng, Shaojing Tang, Xiaodong Zhao, Daxing Zhao. Three-Dimensional Shape Measurement Method of High-Reflective Surfaces Based on Adaptive Fringe-Pattern[J]. Acta Optica Sinica, 2020, 40(5): 0512003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 26, 2019

    Accepted: Nov. 9, 2019

    Published Online: Mar. 10, 2020

    The Author Email: Feng Wei (david2018@hbut.edu.cn)

    DOI:10.3788/AOS202040.0512003

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