Chinese Optics Letters, Volume. 11, Issue 3, 032501(2013)
Echelle dif fraction grating based high-resolution spectrometer-on-chip on SiON waveguide platform
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Xiao Ma, Jianjun He, Mingyu Li. Echelle dif fraction grating based high-resolution spectrometer-on-chip on SiON waveguide platform[J]. Chinese Optics Letters, 2013, 11(3): 032501
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Received: Sep. 11, 2012
Accepted: Nov. 16, 2012
Published Online: Jan. 29, 2013
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