Opto-Electronic Engineering, Volume. 47, Issue 6, 190388(2020)

Electrowetting defect image segmentation based on improved Otsu method

Liao Qinkai1...2,*, Lin Shanling1,2, Lin Zhixian1,2, Chen Zheliang1,2, Li Tiantian1,2 and Tang Biao3 |Show fewer author(s)
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    Liao Qinkai, Lin Shanling, Lin Zhixian, Chen Zheliang, Li Tiantian, Tang Biao. Electrowetting defect image segmentation based on improved Otsu method[J]. Opto-Electronic Engineering, 2020, 47(6): 190388

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    Paper Information

    Category: Article

    Received: Jul. 6, 2019

    Accepted: --

    Published Online: Oct. 27, 2020

    The Author Email: Qinkai Liao (610402018@qq.com)

    DOI:10.12086/oee.2020.190388

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