Effect of Wavelength Drift on PLSR Calibration Model of Near-Infrared Spectroscopy

Qi-peng LU; Dong-min WANG; Yuan SONG; Hai-quan DING; Hong-zhi GAO

doi:10.3964/j.issn.1000-0593(2022)02-0405-05

Spectroscopy and Spectral Analysis, Volume. 42, Issue 2, 405(2022)

Effect of Wavelength Drift on PLSR Calibration Model of Near-Infrared Spectroscopy

Qi-peng LU^1、*, Dong-min WANG^{2、2; *;}, Yuan SONG^{1、1; *;}, Hai-quan DING^3、3;, and Hong-zhi GAO^3、3;

¹1. State Key Laboratory of Applied Optics Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

²2. School of Food Science and Technology, Henan University of Technology, Zhengzhou 450001, China

³3. Guang Dong Spectrastar Instruments Co., Ltd., Guangzhou 510000, China

show less

Abstract Get PDF(in Chinese)

References(6)

[3] L Amodio M, F Ceglie, M Chaudhry M et al. Postharvest Biol. Technol., 125, 112(2017).

[4] Lei Yang, Qianhu Yang, Shihua Yang et al. Journal of Near Infrared Spectroscopy, 23, 391(2015).

[5] S Chanda, K Hazarika A, S Sabhapondit et al. J. Food Sci. Technol., 55, 4867(2018).

[8] Xiaoyu Cui, Cheng Guo, Jin Zhang et al. Analytica Chimica Acta, 13(2018).

[9] Wensheng Cai, Yan Liu, Xueguang Shao. Analytica Chimica Acta, 836, 18(2014).

[11] T Fearn. Journal of Near Infrared Spectroscopy, 9, 229(2001).

Tools

Get Citation

Copy Citation Text

Qi-peng LU, Dong-min WANG, Yuan SONG, Hai-quan DING, Hong-zhi GAO. Effect of Wavelength Drift on PLSR Calibration Model of Near-Infrared Spectroscopy[J]. Spectroscopy and Spectral Analysis, 2022, 42(2): 405

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Research Articles

Received: Jan. 15, 2021

Accepted: Apr. 6, 2021

Published Online: Apr. 2, 2022

The Author Email: LU Qi-peng (luqipeng@126.com)

DOI:10.3964/j.issn.1000-0593(2022)02-0405-05

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology