[1] [1] Yang Xiaohong, Gao Bilie, Cui Xiangqun. New application of stitching interferometry by using Ritchey-Common method for testing the large aperture optical flat [J]. Optical Technique, 2005, 31(4): 611-613.

[2] [2] Proteep C V Mallik, Chunyu Zhao, James H Burge. Measurement of a 2-meter flat using a pentaprism scanning system [J]. Opt Eng, 2007, 46(2): 023602.

[3] [3] Shao Jing, Ma Dongmei, Nie Zhenwei. Accurate test of optical wavefront for optical imaging system [J]. Optics and Precision Engineering, 2011, 19(11): 2583-2588.

[4] [4] Li Zhi, Zhao Yang, Li Dacheng, et al.. A diffractive long trace profiler for large aspherical optics [J]. Acta Optica Sinica, 2002, 22(10): 1224-1228.

[5] [5] Wang Xiaokun. Fabrication and testing of large aperture off-axis SiC asphericmirror [J]. Laser & Optoelectronics Progress, 2011, 49(1): 011201.

[6] [6] Xu Yang, Tang Feng, Wang Xiangchao, et al.. Measurement error analysis of absolute flatness test [J]. Chinese J Lasers, 2011, 38(10): 1008009.

[7] [7] Wang Xiaokun, Zheng Ligong, Zhang Xuejun. Testing convex aspheres by subaperture stitching interferometry [J]. Acta Optica Sinica, 2010, 30(7): 2022-2026.

[8] [8] Cui Tiangang, Zhang Hongji, Ma Wensheng, et al.. Design of online measuring device for surface profile of Wolter type-I mirror [J]. Optics and Precision Engineering, 2010, 18(8): 1082-1087.

[9] [9] Zhang Jinping, Zhang Xuejiun, Zhang Zhongyu, et al.. Test of rotationally symmetric aspheric surface using Shack-Hartmann wavefront sensor [J]. Optics and Precision Engineering, 2012, 20(3): 492-497.

[10] [10] Chai Liqun, Shi Qikai, Wei Xiaohong, et al.. Testing of root mean square of mid-spatial-frequency wavefront for large flat [J]. Chinese J Lasers, 2012, 39(1): 0108003.

[11] [11] Liu Zhaodong. The Research of Calibration and Testing Techniques of Φ600 mm Near-Infrared Phase-Shifting Fizeau Interferometer [D]. Nanjing: Nanjing University of Science and Technology, 2011. 55-82.

[12] [12] K L Shu. Ray-trace analysis and data reduction method for the Ritchey-Common test [J]. Appl Opt, 1983, 22(12): 1879-1886.

[13] [13] D Malacala. Optical Shop Testing [M]. New York: Wiley, 2007.

[14] [14] Sen Han, Erik Novak, Mike Schurig. Ritchey-common test used for measurement of astronomical optic [C]. SPIE, 2003, 4842: 270-273.

[15] [15] Zhu Shuo, Zhang Xiaohui. Analysis andverification for accuracy of Ritchey angle in flat mirror test [J]. Acta Optica Sinica, 2013, 33(6): 0612001.

[16] [16] ZYGO Corporation. GPI XP/D and GPI PE Metropro Application [M]. Connecticut: ZYGO Corporation, 2007.

[17] [17] Wang Rudong, Tian Wei, Wang Ping, et al.. Analysis of vibration effect to surface figure measurment [J]. Acta Optica Sinica, 2012, 32(11): 1112001.