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Opto-Electronic Engineering, Volume. 41, Issue 11, 78(2014)

Background Measurement and Analysis for Spectral Detection

CAO Lei1...2,3,4,*, CHEN Hongbin1,3, QIU Qi2, REN Ge1,3, SHI Jianliang1,3, and QI Bo13 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    CAO Lei, CHEN Hongbin, QIU Qi, REN Ge, SHI Jianliang, QI Bo. Background Measurement and Analysis for Spectral Detection[J]. Opto-Electronic Engineering, 2014, 41(11): 78

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    Received: May. 25, 2014

    Accepted: --

    Published Online: Dec. 8, 2014

    The Author Email: Lei CAO (terrytsao@126.com)

    DOI:10.3969/j.issn.1003-501x.2014.11.013

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology