Optics and Precision Engineering, Volume. 19, Issue 11, 2551(2011)
High precision measurement of taper for taper gauge by optical interference method
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KANG Yan-hui, ZHANG Heng. High precision measurement of taper for taper gauge by optical interference method[J]. Optics and Precision Engineering, 2011, 19(11): 2551
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Received: Mar. 28, 2011
Accepted: --
Published Online: Dec. 5, 2011
The Author Email: Yan-hui KANG (yanhuikang@163.com)
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