Infrared and Laser Engineering, Volume. 51, Issue 6, 20210517(2022)

A near-infrared binocular system for optical instrument tracking

Jie Wang, Chongliang Zhong, and Weidong Zhu*
Author Affiliations
  • School of Mechanical Engineering, Zhejiang University, Hangzhou 310027, China
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    Figures & Tables(16)
    Sensor test
    Sensor acquisition
    System principle framework
    Marking instrument
    (a) Contour error extraction; (b) Correct contour extraction
    Plane fitting
    (a) Symmetric subset; (b) Asymmetric subset
    (a) Mutual position; (b) Instrument marking sequence
    (a) Multiple instruments identification; (b) Add interference
    Tip rotation test
    • Table 1. tr threshold selection

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      Table 1. tr threshold selection

      ThresholdNumber
      0.4008
      0.3007
      0.2267
      0.2256
      0.2246
      0.2006
      0.1006
    • Table 2. ts threshold selection

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      Table 2. ts threshold selection

      ThresholdNumber
      0.0124
      0.0114
      0.0103
      0.0093
      0.0083
    • Table 3. Types of instruments

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      Table 3. Types of instruments

      ${{{L_1}} \mathord{\left/ {\vphantom {{{L_1}} {{L_2}}}} \right. } {{L_2}}}$${{{L_3}} \mathord{\left/ {\vphantom {{{L_3}} {{L_4}}}} \right. } {{L_4}}}$Types of devices
      > 1> 1A
      < 1< 1B
      > 1< 1C
    • Table 4. Time required for multiple instruments identification (Unit:ms)

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      Table 4. Time required for multiple instruments identification (Unit:ms)

      Number of instrumentsFour interfering light sourcesNo interfering light sources
      143
      24.23.5
      34.54
    • Table 5. Positioning accuracy test(Unit:mm)

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      Table 5. Positioning accuracy test(Unit:mm)

      Position5 mm10 mm15 mm20 mm
      15.108710.310415.510020.5739
      26.313610.634815.760820.8322
      35.106010.092615.126820.3387
      46.428212.494418.397523.2675
      55.292310.499415.638020.8859
      66.082311.619816.855222.4211
      RMSE0.61950.92521.21601.1768
      MAE0.55280.74350.94110.9718
    • Table 6. Dynamic tracking verification (Unit:mm)

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      Table 6. Dynamic tracking verification (Unit:mm)

      DistanceTrue valueMax errorRMSEMAE
      D1670.50.40720.61840.5254
      D1470.70.17200.52050.4097
      D241001.06540.57650.4619
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    Jie Wang, Chongliang Zhong, Weidong Zhu. A near-infrared binocular system for optical instrument tracking[J]. Infrared and Laser Engineering, 2022, 51(6): 20210517

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    Paper Information

    Category: Infrared technology and application

    Received: Aug. 1, 2021

    Accepted: --

    Published Online: Dec. 20, 2022

    The Author Email: Weidong Zhu (wdzhu@zju.edu.cn)

    DOI:10.3788/IRLA20210517

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